Examination of electrical properties of metal/GaSb junctions using metal-GaSb alloys

Koichi Nishi

Presentation information

Oral presentation

13. Semiconductors A (Silicon) » 13.4 Devices/Integration Technologies

[19p-F12-1~20] 13.4 Devices/Integration Technologies

Wed. Mar 19, 2014 1:30 PM - 6:45 PM F12 (F408)

6:15 PM - 6:30 PM

[19p-F12-19] Examination of electrical properties of metal/GaSb junctions using metal-GaSb alloys

^○Koichi Nishi^1,2, SangHyeon Kim^1,2, Masafumi Yokoyama¹, Haruki Yokoyama³, Mitsuru Takenaka^1,2, Shinichi Takagi^1,2 (Tokyo Univ.¹, JST CREST², NTT Photonics Lab.³)

Keywords:GaSb

« Previous in this session
Next in this session »

▲