The 61st JSAP Spring Meeting, 2014

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Symposium planned by Program Committee » Beyond vacuum condition: challenges in electron/ion-based analysis in real environments

[19p-F7-1~7] Beyond vacuum condition: challenges in electron/ion-based analysis in real environments

Wed. Mar 19, 2014 2:00 PM - 5:30 PM F7 (F307)

2:45 PM - 3:15 PM

[19p-F7-3] Development of Atmospheric Scanning Electron Microscope

○Mitsuo Suga1, Hidetoshi Nishiyama1, Chikara Sato2 (JEOL1, AIST2)

Keywords:大気圧SEM,液中観察,動的観察