The 61st JSAP Spring Meeting, 2014

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Symposium planned by Program Committee » Beyond vacuum condition: challenges in electron/ion-based analysis in real environments

[19p-F7-1~7] Beyond vacuum condition: challenges in electron/ion-based analysis in real environments

Wed. Mar 19, 2014 2:00 PM - 5:30 PM F7 (F307)

3:15 PM - 3:45 PM

[19p-F7-4] Development of In Situ Electron Microscopy Techniques Using Ionic Liquid

○Susumu Kuwabata1, Taro Uematsu1, Tetsuya Tsuda1, Tsukasa Torimoto2 (Osaka Univ.1, Nagoya Univ.2)

Keywords:イオン液体,電子顕微鏡,in situ