[20a-D5-1~8] 6.6 Probe microscopy

[20a-D5-4] Simultaneous Imaging of Electric and Magnetic Field on (Bi0.6Ba0.4)FeO3 Multiferroic Films by Alternating Force Microscopy

Jia Lu¹, Genta Egawa^1,3, Yukinori KInoshita^2,3, Satoru Yoshimura^1,3, ^○Hitoshi Saito^1,3 (Akita Univ.¹, VBL, Akita Univ.², JST/Adv. Meas. & Analysis³)

Keywords:磁気力顕微鏡,電気力顕微鏡