[20a-F12-1~13] 13.4 Devices/Integration Technologies

[20a-F12-13] Bias-stress Reliability of OFF-state Complementary Atom Switch

^○Naoki Banno¹, Munehiro Tada¹, Toshitsugu Sakamoto¹, Makoto Miyamura¹, Koichiro Okamoto¹, Noriyuki Iguchi¹, Tatsuhiko Nohisa¹, Hiromitsu Hada¹ (LEAP¹)

Keywords:原子スイッチ,抵抗変化素子,不揮発