The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

13 Semiconductors » 13.4 Si wafer processing /MEMS/Integration technology

[13a-1C-1~10] 13.4 Si wafer processing /MEMS/Integration technology

Sun. Sep 13, 2015 9:00 AM - 11:45 AM 1C (135)

座長:河本 直哉(山口大),松尾 直人(兵庫県立大)

9:45 AM - 10:00 AM

[13a-1C-4] Evaluation of Poly-Si Thin Film by Raman Spectroscopy and Lifetime Measurement Using UV Excitation

〇ryo yokogawa1, Takahiro Suzuki1, Atsushi Ogura1 (1.Meiji Univ.)

Keywords:Raman Spectroscopy,poly-Si,Lifetime