The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

13 Semiconductors » 13.9 Optical properties and light-emitting devices

[14a-2B-1~10] 13.9 Optical properties and light-emitting devices

Mon. Sep 14, 2015 9:30 AM - 12:15 PM 2B (211-2)

座長:今北 健二(神戸大)

11:45 AM - 12:00 PM

[14a-2B-9] Noise analyses of GaN:Eu red LED: A new application to measure charge capturing properties of emission centers

〇Masashi Ishii1, Atsushi Koizumi2, Yasufumi Fujiwara2 (1.NIMS, 2.Osaka Univ.)

Keywords:GaN,Eu,Noise

We analyzed current noise of GaN:Eu red LED to identify limiting process of the emission. The noise of a conventional LED indicated Poisson distribution, while that of GaN:Eu LED provided 1/f noise. The result suggests that the limiting process is charge capturing. The 1/f spectrum had discontinuous points that can be explained with charge capturing of various emission centers in the LED.