10:45 AM - 11:00 AM
[14a-4C-7] Study of High-quality Crystalline La2O3/Ge(111) Interface by using XPS Analyses
Keywords:XPS,La2O3,epitaxial
Oral presentation
13 Semiconductors » 13.3 Insulator technology
Mon. Sep 14, 2015 9:00 AM - 11:45 AM 4C (432)
座長:渡部 平司(阪大),井上 真雄(ルネサス)
10:45 AM - 11:00 AM
Keywords:XPS,La2O3,epitaxial