[14a-4E-1~7] 7.4 Buried interface sciences with quantum beam

[14a-4E-4] Compositional Analysis of changes in X-ray-induced-force-field in the vicinity of a sample surface by means of XANAM

〇Shushi Suzuki¹, Shingo Mukai², Wang-Jae Chun³, Masaharu Nomura⁴, Kiyotaka Asakura² (1.Nagoya Univ., 2.Hokkaido Univ., 3.ICU, 4.KEK-PF)

Keywords:X-ray,Atomic Force Microscopy,Force Field

For advancing nanoscale-elemental analysis, we hvae developed XANAM based on synchrotron radiation X-ray and noncontact atomic force microscopy. To clarify X-ray energy dependencies more, analyses of forces were made to divide electrostatic force, van der Waals force, and covalent force. An effect of patch charges induced by X-ray was also treated to model a X-ray induced phenomenon in the vicinity of a surface.