The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.6 Ion beams

[14p-4E-1~21] 7.6 Ion beams

Mon. Sep 14, 2015 12:30 PM - 6:15 PM 4E (437)

座長:阿保 智(阪大),瀬木 利夫(京大),柳沢 淳一(滋賀県立大)

5:00 PM - 5:15 PM

[14p-4E-17] Detection of multiply charged ions by using TOF-MS and charge-changing analysis

〇Hiroshi Tsuji1, Yu Tsudome1, Yasuhito Gotoh1 (1.Kyoto Univ.)

Keywords:Ion analysis,same mass-to-charge ratio,multiply charged ion

In mass spectroscopy, in general, variable magnetic field or time-of-flight methods are used in mass spectroscopy. But the both give us only the mass-to-charge ratio (m/z) of ion, which means both of a single-charged ion of lighter atom and a multiple-charged ion of heavy atom and molecule at the same time. The further identification of ion required a much large facility such as accelerator. In order to investigate the including multiple-charged ion by easier method, we have tried to detection of multiple-charged ion of Xe by using charge-changing cell and simple electrostatic energy analyzer as well as TOF-MS.