[14p-4E-1~21] 7.6 Ion beams

[14p-4E-20] Temperature-programmed TOF-SIMS on quench-condensed solid surfaces

〇Taku Suzuki¹, Isao Sakaguchi¹ (1.NIMS)

Keywords:Secondary ion mass spectroscopy,Low-energy ion scattering spectroscopy,Cryogenic surfaces

Recent our study suggests that surface melting may be detected by temperature-programmed SIMS (TP-SIMS) measurements. In the present study, we have studied TP-SIMS on quench-condensed rare gas surfaces. Furthermore, we have developed UHV compatible liquid-He-free cryostat combined with a two-axis rotatable energy analyzer, which enable structure analysis of cryogenic surfaces by low-energy He+ ion scattering spectroscopy.