[14p-PB5-1~15] 12.2 Characterization and Materials Physics

[14p-PB5-5] Elucidation of Electronic State in Gate Insulator as Running Organic Thin-film Transistor by Bias Applied - Hard X-ray Photoelectron Spectroscopy

〇keisuke tada¹, Takeshi Watanabe², Satoshi Yasuno², Daichi Hironai¹, Noriyuki Yoshimoto¹, Ichiro Hirosawa² (1.Iwate Univ., 2.JASRI)

Keywords:organic thin film transistor,hard x-ray photoelectron spectroscopy