The 76th JSAP Autumn Meeting, 2015

Presentation information

Poster presentation

15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[14p-PB7-1~5] 15.8 Crystal evaluation, impurities and crystal defects

Mon. Sep 14, 2015 4:00 PM - 6:00 PM PB7 (Shirotori Hall)

4:00 PM - 6:00 PM

[14p-PB7-5] Evaluation of GaN wafer for power devices by Raman Spectroscopy (4)

〇(M1)Kazuya Agui1, Hidekazu Yamamoto1 (1.Chibakou Inst.)

Keywords:Power Devices,GaN