11:30 AM - 11:45 AM
△ [15a-1A-10] Control of Carrier Lifetimes in Thick n-type SiC Epilayers by High-Temperature Annealing
Keywords:SiC,Point Defect,Carrier Lifetime
Oral presentation
15 Crystal Engineering » 15.6 Group IV Compound Semiconductors (SiC)
Tue. Sep 15, 2015 9:00 AM - 12:00 PM 1A (131+132)
座長:原田 俊太(名大)
11:30 AM - 11:45 AM
Keywords:SiC,Point Defect,Carrier Lifetime