[15a-2S-1~11] 16.3 Bulk, thin-film and other silicon-based solar cells

△ [15a-2S-8] Evaluations of Carrier Recombination with Metal Impurities at Small Angle Grain Boundaries in n-type Multicrystalline Silicon by PL Imaging

〇(M1)Ryota Suzuki¹, Norihiro Ikeno^1,2, Tomihisa Tachibana^3,4, Yoshio Ohshita³, Atushi Ogura¹ (1.Meiji Univ., 2.JSPS Reseach Fellow DC, 3.Toyota Inst., 4.FREA)

Keywords:PL,small angle grain boundary,multicrystalline silicon