The 76th JSAP Autumn Meeting, 2015

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Poster presentation

13 Semiconductors » 13.2 Exploratory Materials, Physical Properties, Devices

[15a-PB3-1~12] 13.2 Exploratory Materials, Physical Properties, Devices

Tue. Sep 15, 2015 9:30 AM - 11:30 AM PB3 (Shirotori Hall)

9:30 AM - 11:30 AM

[15a-PB3-1] Thickness dependence of grain size of BaSi2 films on Si(111) substrates by MBE

〇Daichi Tsukahara1, Masakazu Baba1, Kaoru Toko1, Takashi Suemasu1,2 (1.Univ. Tsukuba, 2.JST-CREST)

Keywords:AFM,grain size