[15p-2G-1~16] 3.12 Nanoscale optical science and near-field optics

[15p-2G-13] Dark-field measurement of enhanced electric fields of a TERS tip top

〇Tamitake Itoh¹, Yasutaka Kitahama³, Toshiaki Suzuki², Yuko Yamamoto S.⁴, Yukihiro Ozaki³ (1.AIST, 2.UNISOKU Co.,Ltd., 3.Kwansei-gakuin Univ., 4.Kagawa Univ.)

Keywords:Tip enhanced Raman scattering (TERS),local plasmon resonance,dark field illumination

Tip enhanced Raman scattering (TERS) spectroscopy enables us to analyze molecular structures with the spatial resolution of nanometer. The origin of the Raman enhancement is local plasmon resonance at TERS tip tops. Thus experimental evaluation of the local plasmon is important for development of TERS tips. In the present study, we report imaging of local plasmon at tip top by dark field illumination and comparison the image with SEM images.