[15p-2H-1~6] Recent Trend of Analysis Techniques for Functional Materials and Devices

[15p-2H-1] Scanning Probe Microscopy for Functional Materials and Devices

〇Yasuhiro Sugawara¹ (1.Osaka Univ.)

Keywords:scanning probe microscopy,Kelvin probe force microscopy,surface potential

We discuss recent trend of analysis techniques such as scanning probe microscopies for investigating functional materials and devices.