The 76th JSAP Autumn Meeting, 2015

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Symposium » Recent Trend of Analysis Techniques for Functional Materials and Devices

[15p-2H-1~6] Recent Trend of Analysis Techniques for Functional Materials and Devices

Tue. Sep 15, 2015 1:45 PM - 5:00 PM 2H (222)

座長:長 康雄(東北大),菅原 康弘(阪大)

2:45 PM - 3:15 PM

[15p-2H-3] Evaluation of Functional Materials Using Kelvin Probe Force Microscopy

〇Yanjun Li1 (1.Osaka Univ.)

Keywords:Atomic force microscopy,Kelvin probe force microscopy,Functional material