[15p-2N-1~17] 12.2 Characterization and Materials Physics

[15p-2N-2] Charge Transport Evaluation Technique at PN junction interface in organic device

〇Wookjin CHOI¹, Yusuke Tsutsui¹, Junichi Inoue¹, Tsuneaki Sakurai¹, Shu Seki¹ (1.Kyoto Univ.)

Keywords:Organic device,PN junction,Microwave resonance

As the model of hetero interface structure in organic photovoltaic device, pn junction device is fabricated with PCBM as n type material and C₈-BTBT as p type material. With the charge injection into this device, the charge carrier mobility is evaluated by measuring the dielectric loss of material with microwave resonance techinque. Combining the displacement current measurement result, several phenomenons are elucidated that the charge carrier mobility strongly depends on the location of carriers and CT states exist at the pn junction interface.