The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

13 Semiconductors » 13.2 Exploratory Materials, Physical Properties, Devices

[15p-2R-1~22] 13.2 Exploratory Materials, Physical Properties, Devices

Tue. Sep 15, 2015 1:30 PM - 7:15 PM 2R (231-2)

座長:立岡 浩一(静岡大),鵜殿 治彦(茨城大)

5:45 PM - 6:00 PM

[15p-2R-17] Control of Electrical Properties of BaSi2 Thin Films by Alkali-metal-fluoride Treatment

〇Kosuke Hara1,2, Weijie Du3, Keisuke Arimoto1, Junji Yamanaka1, Kiyokazu Nakagawa1, Kaoru Toko3, Takashi Suemasu2,3, Noritaka Usami2,4 (1.Univ. Yamanashi, 2.JST-CREST, 3.Univ. Tsukuba, 4.Nagoya Univ.)

Keywords:Silicide semiconductor,Impurity doping,Alkali metal

We have investigated the alkali-metal doping of BaSi2 films by means of the deposition of alkali-metal fluorides followed by annealing. It has been found that LiF treatment with annealing at 400 and 500 oC enhances electron density up to 1020 cm−3 while NaF or KF treatment is not effective for carrier density control. A doping mechanism is proposed based on structural characterization that Li is incorporated into BaSi2 as a donor at the same time as the dissociation of LiF.