The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[15p-4E-1~23] 7.2 Applications and technologies of electron beams

Tue. Sep 15, 2015 1:15 PM - 7:30 PM 4E (437)

座長:村田 英一(名城大),嶋脇 秀隆(八戸工大)

3:30 PM - 3:45 PM

[15p-4E-10] Differential phase-contrast microscopy by a Hilbert phase-plate using the Aharonov-Bohm effect

〇Takafumi Ishida1,2, Wei Li1, Takayoshi Tanji1,2 (1.Nagoya Univ., 2.GREEN)

Keywords:phase plate,TEM

A Hilbert-type phase-plate using the Aharonov-Bohm (A-B) effect is applied to transmission electron microscopy (TEM). This type of phase-plates presents the differential phase contrast of objects. A ferromagnetic material on an ultra-thin filament makes the phase shift of electron waves between both sides of the filament. The sufficient phase shift for contrast enhancement is confirmed by electron holography. This phase-plate is inserted in the back focal plane of the objective lens of a conventional TEM equipped with a field-emission gun. We will show that the shape of biological specimens can be effectively emphasized using the A-B effect phase-plate.