The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[15p-4E-1~23] 7.2 Applications and technologies of electron beams

Tue. Sep 15, 2015 1:15 PM - 7:30 PM 4E (437)

座長:村田 英一(名城大),嶋脇 秀隆(八戸工大)

2:45 PM - 3:00 PM

[15p-4E-7] Development of electrostatic Cs-corrector with annular and circular electrodes (Simulations)

〇Yasuyuki Takai1, Yuki Ogawa1, Tadahiro Kawasaki2,3, Takafumi Ishida3, Tetsuji Kodama1, Takashi Ikuta4 (1.Meijo Univ., 2.JFCC, 3.EcoTopia Sci. Inst., Nagoya Univ, 4.Osaka Electro-Communication Univ)

Keywords:spherical-aberration-corrector,electrostatic lens,STEM

A simple spherical-aberration-corrector which consists of annular/ circular electrodes and a constant-voltage supply has been newly developed. Before constructing the apparatus, simulation has been done in advance to investigate appropriate parameters for correcting the aberration of a STEM optical system. In this study, aberration coefficient Cs which the corrector produces were examined by calculating three-dimensional electric field between two electrodes and electron beam trajectories in the field. The simulation results determine the voltage required for the residual aberration in the objective lens to be zero. In addition, desired accuracies for the electrodes in fabrication and assembling were evaluated.