Performance degradation caused by Dit in GaAsSb/InGaAs Double-Gate Vertical Tunnel FETs

Presentation information

Oral presentation

13 Semiconductors » 13.5 Semiconductor devices and related technologies

Wed. Sep 16, 2015 9:00 AM - 12:00 PM 1C (135)

座長:太田裕之(産総研)

10:15 AM - 10:30 AM

〇shinjiro iwata¹, Kazumi Ohashi¹, Seiko Netsu¹, Koichi Fukuda², Yasuyuki Miyamoto¹ (1.Tokyo Tech., 2.AIST.)

Keywords:Tunnel FET,InGaAs,Dit