[16a-2D-5~12] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[16a-2D-11] Charge Collection in Semiconductor Devices Irradiated by Pulsed-laser using
Two-Photon Absorption Process.

〇HIROAKI ITSUJI^1,2, Daisuke Kobayashi^1,2, Kazuyuki Hirose^1,2 (1.Univ. Tokyo, 2.ISAS/JAXA)

Keywords:soft error,two-photon absorption