11:15 AM - 11:30 AM
[16a-2D-9] Determination of Si and SiO2 Valence Band Edge using by XPS
Keywords:XPS,valence band,electron affinity
Presentation information
Oral presentation
13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials
[16a-2D-5~12] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials
Wed. Sep 16, 2015 10:15 AM - 12:15 PM 2D (212-2)
座長:上野 智雄(農工大)