The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

13 Semiconductors » 13.2 Exploratory Materials, Physical Properties, Devices

[16a-2R-1~11] 13.2 Exploratory Materials, Physical Properties, Devices

Wed. Sep 16, 2015 9:00 AM - 12:00 PM 2R (231-2)

座長:末益 崇(筑波大)

11:15 AM - 11:30 AM

[16a-2R-9] Thermal Expansion of beta-FeSi2 and Mg2Si

〇Motoharu Imai1, Yukihiro Isoda1, Haruhiko Udono2 (1.NIMS, 2.Ibaraki Univ.)

Keywords:silicides,X-ray diffraction,thermal expansion

We measured X-ray diffraction patters of beta-FeSi2 and Mg2Si at high temperatures. We determined the thermal expansion coefficients from the temperature dependence of lattice constants.