[16a-2U-1~12] 6.6 Probe Microscopy

[16a-2U-10] Dielectric Relaxation Analysis by Using Atomic Force Microscopy

〇Masami Kageshima¹ (1.Kansai Medical Univ.)

Keywords:atomic force microscopy,dielectric relaxation,polymer film

Dielectric relaxation measurement, one of the most popular dynamical analysis methods for soft materials, is combined with atomic force microscopy (AFM) measurement. Both a sample and a insulating AFM tip are placed under oscillating electric field, and the component of field frequency in the frequency shift signal of the cantilever oscillation was detected via lock-in technique to derive the dielectric response signal. With a phase-separated film of poly (vinyl acetate) (PVAc) and polystyrene (PS) a relaxation signal characteristic of PVAc was detected. Details of the obtained response function and spatial resolution will be discussed.