[11a-A27-1~13] 13.1 Fundamental properties, surface and interface, and simulations ofSi related materials

△ [11a-A27-7] Relationship between Ag Coverage and Signal Enhancement In the Raman Analysis of the Strained-Si Surface

〇Takahiro Kijims¹, Shotaro Yamamoto¹, Ryo Yokogawa¹, Kazuma Takeuchi¹, Tatsumi Murakami¹, Daisuke Kosemura¹, Atsushi Ogura¹ (1.Meiji Univ.)

Keywords:Raman,surface enhanced Raman spectroscopy,Strained Silicon