The 62nd JSAP Spring Meeting, 2015

Presentation information

Symposium

Symposium » State of the art technology in electron and focused-ion-beam apparatuses

[11p-B3-1~9] State of the art technology in electron and focused-ion-beam apparatuses

Wed. Mar 11, 2015 1:15 PM - 5:15 PM B3 (6B-103)

2:00 PM - 2:30 PM

[11p-B3-3] Introduction of cutting-edge technology in transmission electron microscope

〇Eiji Okunishi1, Masaki Mukai1, Yu Jimbo1, Hidetaka Sawada1 (1.JEOL Ltd.)

Keywords:TEM