The 62nd JSAP Spring Meeting, 2015

Presentation information

Symposium

Symposium » State of the art technology in electron and focused-ion-beam apparatuses

[11p-B3-1~9] State of the art technology in electron and focused-ion-beam apparatuses

Wed. Mar 11, 2015 1:15 PM - 5:15 PM B3 (6B-103)

4:15 PM - 4:45 PM

[11p-B3-7] Helium Ion Microscopy Technology for Characterization and Fabrication

〇Shinichi Ogawa1 (1.AIST NeRI)

Keywords:helium ion microscope,characterization,fabrication