The 62nd JSAP Spring Meeting, 2015

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13 Semiconductors » 13.6 Semiconductor English Session

[12a-A23-1~12] 13.6 Semiconductor English Session

Thu. Mar 12, 2015 9:00 AM - 12:15 PM A23 (6A-216)

9:45 AM - 10:00 AM

▲ [12a-A23-4] Non-destructive Characterization of Oxide/Ge Interface by Photoluminescence Measurement

〇Shoichi Kabuyanagi1, 2, Tomonori Nishimura1, 2, Takeaki Yajima1, 2, Akira Toriumi1, 2 (1.Tokyo Univ., 2.JST-CREST)

Keywords:Germanium,Photoluminescence,Interface