Carrier density depth profiling analysis of GaN by infrared reflection spectrum

Presentation information

Oral presentation

15 Crystal Engineering » 15.4 III-V-group nitride crystals

Thu. Mar 12, 2015 8:30 AM - 11:45 AM B1 (6B-101)

9:15 AM - 9:30 AM

〇Takaaki Kamijoh¹, Bei Ma¹, Ken Morita¹, Yoshihiri Ishitani¹ (1.Chiba Univ)

Keywords:Infrared reflection spectrum