Development of the Low Temperature Atomic Force Microscopy with Microwave Unit

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

Thu. Mar 12, 2015 10:00 AM - 11:45 AM D9 (16-304)

11:00 AM - 11:15 AM

〇Eiji Arima¹, Ikumi Tokuda¹, Yoshitaka Naitoh¹, Yan Jun Li¹, Yasuhiro Sugawara¹ (1.Osaka Univ)

Keywords:atomic force microscopy,magnetic exchange force,spintronics