The 62nd JSAP Spring Meeting, 2015

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15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[12p-A18-1~18] 15.8 Crystal evaluation, impurities and crystal defects

Thu. Mar 12, 2015 2:00 PM - 7:00 PM A18 (6A-208)

2:00 PM - 2:15 PM

▲ [12p-A18-1] Formation of polycrystalline Silicon Layer on Quartz substrate by Aluminium-induced Crystallization

〇(M1)Joko Suwardy1, 2, Wipakorn Jevasuwan1, Kaoru Toko2, Takashi Suemasu2, Naoki Fukata1, 2 (1.National Institute for Materials Science, 2.Univ. of Tsukuba)

Keywords:silicon,crystallization