The 62nd JSAP Spring Meeting, 2015

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13 Semiconductors » 13.5 Semiconductor devices and related techologies

[12p-A23-1~11] 13.5 Semiconductor devices and related techologies

Thu. Mar 12, 2015 2:00 PM - 5:30 PM A23 (6A-216)

4:45 PM - 5:00 PM

▲ [12p-A23-9] Measurements and Statistical Comparison of Four Write Stability Metrics in Bulk CMOS SRAM Cells

〇(D)Hao Qiu1, Tomoko Mizutani1, Takuya Saraya1, Toshiro Hiramoto1 (1.IIS, Univ. of Tokyo)

Keywords:bulk SRAM cells,write noise margin,variability