[12p-A23-1~11] 13.5 デバイス／集積化技術

▲ [12p-A23-9] Measurements and Statistical Comparison of Four Write Stability Metrics in Bulk CMOS SRAM Cells

〇(D)Hao Qiu¹, Tomoko Mizutani¹, Takuya Saraya¹, Toshiro Hiramoto¹ (1.IIS, Univ. of Tokyo)

キーワード：bulk SRAM cells,write noise margin,variability