The 62nd JSAP Spring Meeting, 2015

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13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations ofSi related materials

[12p-A27-1~15] 13.1 Fundamental properties, surface and interface, and simulations ofSi related materials

Thu. Mar 12, 2015 2:00 PM - 6:00 PM A27 (6A-202)

5:45 PM - 6:00 PM

[12p-A27-15] Feasibility study on soft-error simulation with a model for radiation-induced increase in local temperature

〇Daisuke Kobayashi1, 2, Taichi Ito1, Kazuyuki Hirose1, 2 (1.ISAS/JAXA, 2.U. Tokyo)

Keywords:soft error,radiation,reliability