The 62nd JSAP Spring Meeting, 2015

Presentation information

Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations ofSi related materials

[12p-A27-1~15] 13.1 Fundamental properties, surface and interface, and simulations ofSi related materials

Thu. Mar 12, 2015 2:00 PM - 6:00 PM A27 (6A-202)

3:45 PM - 4:00 PM

[12p-A27-7] First-Principles calculation of defect levels and defect-formation energies in 4H-SiC

〇Nobuhiko Kato1, Kazuyuki Okazaki1, Hideaki Koike1 (1.AdvanceSoft.Corp)

Keywords:4H-SiC,first-principles calculation,lattice defects