The 62nd JSAP Spring Meeting, 2015

Presentation information

Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations ofSi related materials

[12p-A27-1~15] 13.1 Fundamental properties, surface and interface, and simulations ofSi related materials

Thu. Mar 12, 2015 2:00 PM - 6:00 PM A27 (6A-202)

4:15 PM - 4:30 PM

[12p-A27-9] Analysis of breakdown voltage in Si-nMOSFET with trapezoidal channel

〇Yoshihiro Yamada1, Yasuyuki Ookura1, Ken Yamaguchi1, Hideaki Koike1 (1.AdvanceSoft Corporation)

Keywords:MOSFET