The 62nd JSAP Spring Meeting, 2015

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Symposium » How should we behave as future scientists? - Innovative value creation of integration technology by young generations -

[12p-A29-1~11] How should we behave as future scientists? - Innovative value creation of integration technology by young generations -

Thu. Mar 12, 2015 1:00 PM - 5:00 PM A29 (6A-204)

2:00 PM - 2:15 PM

[12p-A29-3] Thermal-Aware Device Design of FinFETs for Low Power Operations

〇Tsunaki Takahashi1, 2, Ken Uchida1, 2 (1.Keio Univ., 2.CREST, JST)

Keywords:self-heating effects,FinFET