Effectiveness of surface potential fluctuation for representing inversion-layer mobility limited by Coulomb scattering in MOSFETs

Presentation information

Oral presentation

13 Semiconductors » 13.3 Insulator technology

Fri. Mar 13, 2015 9:00 AM - 12:30 PM A24 (6A-217)

10:30 AM - 10:45 AM

〇(D)Weili Cai^1,², Mitsuru Takenaka^1,², Shinichi Takagi^1,² (1.Tokyo Univ., 2.JST CREST)

Keywords:surface potential fluctuation,inversion-layer mobility,Coulomb scattering