The 62nd JSAP Spring Meeting, 2015

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15 Crystal Engineering » 15.6 Group IV Compound Semiconductors

[13a-B4-1~10] 15.6 Group IV Compound Semiconductors

Fri. Mar 13, 2015 9:00 AM - 11:45 AM B4 (6B-104)

9:45 AM - 10:00 AM

[13a-B4-4] Electronic States at Ultrathin SiO2/SiC Interface Measured by Total Photoelectron Yield Spectroscopy (2)

〇Akio Ohta1, Watanabe Hiromasa2, Nguyen Xuan Truyen2, Katsunori Makihara2, Seiichi Miyazaki2 (1.VBL. Nagoya Univ., 2.Nagoya Univ.)

Keywords:photoemission spectroscopy