The 62nd JSAP Spring Meeting, 2015

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15 Crystal Engineering » 15.6 Group IV Compound Semiconductors

[13p-B4-1~9] 15.6 Group IV Compound Semiconductors

Fri. Mar 13, 2015 4:15 PM - 6:30 PM B4 (6B-104)

6:00 PM - 6:15 PM

[13p-B4-8] Special Features in Stress-Degradation of SiC-MOSFETs from I-V Characteristics

〇Eiichi Murakami1, Yuuki Shimizu1, Nozomu Yonemura1, Youhei Hara1 (1.Kyusan Univ.)

Keywords:SiC-MOSFET,NBTI,FN stress degradation