The 62nd JSAP Spring Meeting, 2015

Presentation information

Poster presentation

13 Semiconductors » 13.8 Compound and power electron devices and process technology

[13p-P17-1~24] 13.8 Compound and power electron devices and process technology

Fri. Mar 13, 2015 4:30 PM - 6:30 PM P17 (Gymnasium)

4:30 PM - 6:30 PM

[13p-P17-6] Degradation Mechanism of Bistability Characteristics of GaN/AlN Resonant Tunneling Diodes

〇Masanori Nagase1, Tokio Takahashi1, Mitsuaki Shimizu1 (1.AIST)

Keywords:resonant tunneling diode,nitride semiconductor,MOVPE