The 62nd JSAP Spring Meeting, 2015

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Symposium » Materials science of singularity in nitride semiconductors-Growth, processing and electronic application-

[14p-B1-1~6] Materials science of singularity in nitride semiconductors-Growth, processing and electronic application-

Sat. Mar 14, 2015 12:45 PM - 3:00 PM B1 (6B-101)

2:00 PM - 2:15 PM

[14p-B1-4] Investigation of Critical Thickness for AlGaN/AlN Heterostructures using Time-resolved Photoluminescence Spectroscopy

〇(D)Shuhei Ichikawa1, Yoshiya Iwata1, Mitsuru Funato1, Yoichi Kawakami1 (1.Kyoto Univ.)

Keywords:AlGaN,critical thickness,TRPL