The 62nd JSAP Spring Meeting, 2015

Presentation information

Print

Oral presentation

7 Beam Technology and Nanofabrication » 7.6 Ion beams

[14p-C1-1~8] 7.6 Ion beams

Sat. Mar 14, 2015 1:00 PM - 3:00 PM C1 (6C-104)

2:45 PM - 3:00 PM

[14p-C1-8] Development of Secondary Ion Mass Spectrometry using MeV-energy Heavy Ion Beam for Ambient Analysis

〇Masakazu Kusakari1, Makiko Fujii1, Toshio Seki1, Takaaki Aoki1, Jiro Matsuo1 (1.Kyoto Univ.)

Keywords:Secondary Ion Mass Spectrometry,Ambient Analysis,MeV-energy Heavy Ion