Poster presentation

[13p-P10-1~5] 7.6 Ion beams

Fri. Mar 13, 2015 4:30 PM - 6:30 PM P10 (Gymnasium)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

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4:30 PM - 6:30 PM

[13p-P10-1] Rutherford backscattering analysis of some lithium nitride compounds and GaN using proton beam

〇Yusaku Takeuchi¹, Taiki Tamashita¹, Kazuo Kuriyama¹, Kazumasa Kushida² (1.Hosei Univ., 2.Osaka Kyoiku Univ.)

4:30 PM - 6:30 PM

[13p-P10-2] Development of embedded optical switch in PDMS thin film fabricated by Proton Beam Writing Technique

〇Shunsuke Kawabata¹, Ryota Saruya¹, Hijiri Kato², Jun Araki¹, Kenta Miura¹, Wataru Kada¹, Takahiro Sato³, Masashi Koka³, Yasuyuki Ishii³, Tomihiro Kamiya³, Hiroyuki Nishikawa², Osamu Hanaizumi¹ (1.Gunma Univ., 2.Shibaura Inst. Tech, 3.JAEA)

4:30 PM - 6:30 PM

[13p-P10-3] Negative Hydrogen Ion Beam Extraction from a Low Frequency AC Discharge

〇(B)Shun Yamamoto¹, Yuki Okano¹, Naoki Miyamoto¹, Tosirou Kasuya¹, Motoi Wada¹ (1.Doshisha Univ.)

4:30 PM - 6:30 PM

[13p-P10-4] Metal Ion Beam Extraction from a Radio Frequency Ion Source

〇(B)yuta watanabe¹, shoma kanda¹, toshiro kasuya¹, motoi wada¹ (1.Doshisha Univ.)

4:30 PM - 6:30 PM

[13p-P10-5] Structual Analysis of Water Clusters by Electron Diffraction

Minoru Nakagawa¹, Tohru Kainuma¹, 〇Mitsuaki Takeuchi¹, Hiromichi Ryuto¹, Gikan Takaoka¹ (1.Kyoto Univ.)

Oral presentation

[14a-C1-1~11] 7.6 Ion beams

Sat. Mar 14, 2015 9:00 AM - 12:00 PM C1 (6C-104)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

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9:00 AM - 9:15 AM

[14a-C1-1] Development of pre- and post- processing programs for MARLOWE

〇Takaaki Aoki¹, Toshio Seki¹, Jiro Matsuo¹ (1.Kyoto Univ.)

9:15 AM - 9:30 AM

[14a-C1-2] Development of a cluster ion source using high power impulse magnetron sputtering

〇(M1)Isamu Mizuuchi¹, Kengo Akimoto¹, Hiroaki Yamamoto², Masahide Tona², Keizo Tsukamoto^1,², Motoyoshi Nakano¹, Keijiro Ohshimo¹, Fuminori Misaizu¹ (1.Tohoku Univ, 2.ayabo corp)

9:30 AM - 9:45 AM

[14a-C1-3] Development of Radio Active Cs Imaging Apparatus By using Resonance Ionization Mass Spectrometry

〇(PC)Kenji Ohishi¹, Tetsuo Sakamoto^1,², Isamu Kawakami², Takeo Okumura³ (1.Kogakuin Univ., 2.Atoh Komuten Inc., 3.Japan Neutron Optics)

9:45 AM - 10:00 AM

△ [14a-C1-4] Organic Compounds Analysis with Bismuth Cluster SIMS Apparatus

〇Makiko Fujii¹, Rie Shishido², Shigeru Suzuki², Jiro Matsuo¹ (1.Kyoto Univ., 2.Tohoku Univ.)

10:00 AM - 10:15 AM

[14a-C1-5] Devlopment of 3D molecular imaging technology for organic materials using gas cluster ion beam

〇Keisuke Wakamoto¹, Shunichirou Nakagawa¹, Toshio Seki¹, Takaaki Aoki¹, Jiro Matsuo¹ (1.Kyoto Univ.)

Break （10:15 AM - 10:30 AM）

10:30 AM - 10:45 AM

[14a-C1-6] Non-contact hardness evaluation of the film by Gas Cluster Ion Beam

〇Masahiro Hayashi¹, Noriaki Toyoda¹, Isao Yamada¹ (1.Hyogo Univ.)

10:45 AM - 11:00 AM

[14a-C1-7] Transportation characteristic of Ar cluster ion beam at low vacuum pressure

〇Kanji Suzuki¹, Toshio Seki¹, Takaaki Aoki¹, Jiro Matsuo¹ (1.Kyoto Univ.)

11:00 AM - 11:15 AM

[14a-C1-8] Fine patterns etching with ClF₃ neutral cluster beam

〇Toshio Seki¹, Hiroki Yamamoto², Takahiro Kozawa², Yu Yoshino³, Takehiko Senoo³, Kunihiko Koike³, Takaaki Aoki¹, Jiro Matsuo¹ (1.Kyoto Univ., 2.ISIR Osaka Univ., 3.Iwatani Corp.)

11:15 AM - 11:30 AM

[14a-C1-9] Low temperature deposition of carbon film on Ni surface with GCIB irradiation

〇Daichi Nakayama¹, Yuki Uozumi¹, Noriaki Toyoda¹, Isao Yamada¹ (1.Hyogo Univ.)

11:30 AM - 11:45 AM

[14a-C1-10] Field dependence of abundance of field-ion species in noble gas mixture

〇keisuke komaki¹, shigekazu nagai^1,², tatsuo iwata^1,², kazuo kajiwara^1,², koichi hata^1,² (1.Mie Univ., 2.CUTE.)

11:45 AM - 12:00 PM

[14a-C1-11] Operando measurement of the electrical potential distribution of laminated ceramic capacitors with applied voltage using scanning helium ion microscope

〇Chikako Sakai¹, Nobuyuki Ishida¹, Hideki Masuda¹, Shoko Nagano¹, Daisuke Fujita¹ (1.NIMS)

Oral presentation

[14p-C1-1~8] 7.6 Ion beams

Sat. Mar 14, 2015 1:00 PM - 3:00 PM C1 (6C-104)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

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1:00 PM - 1:15 PM

[14p-C1-1] Oxidation State of Ge Nanoparticles Formed in SiO₂ Layer by Negative-Ion Implantation

〇Hiroshi Tsuji¹, Mikio Kato², Tomokazu Sasaki², Eiichi Nomura³, Yasuhito Gotoh¹ (1.Kyoto Univ., 2.Toshiba Nanoanalysis, 3.Kaihatsu-Jyutaku 21)

1:15 PM - 1:30 PM

[14p-C1-2] Characteristics of Charged Droplet Beams Produced by Vacuum Electrospray

〇Satoshi Ninomiya¹, Yuji Sakai², Lee Chuin Chen¹, Kenzo Hiraoka² (1.Univ. of Yamanashi, 2.CERC Univ. Yamanashi)

1:30 PM - 1:45 PM

[14p-C1-3] Irradiation Effects of Polyatomic Molecular Hydrocarbon Ion Beams on Solid and Liquid Surfaces

〇Isayu Nagayama¹, Kyohei Hayashi¹, Mitsuaki Takeuchi¹, Hiromichi Ryuto¹, Gikan Takaoka¹ (1.Kyoto Univ.)

1:45 PM - 2:00 PM

[14p-C1-4] Sputtering Characteristics of Ionic Liquid EMIM-DCA Ion Beams

〇Yuki Hoshide¹, Mitsuaki Takeuchi¹, Hiromichi Ryuto¹, Gikan Takaoka¹ (1.Kyoto Univ.)

2:00 PM - 2:15 PM

[14p-C1-5] Secondary Ion Mass Spectrometry (SIMS) of Organic Samples Using Ionic-liquid Beam Irradiation

〇Yukio Fujiwara¹, Naoki Saito¹ (1.AIST)

2:15 PM - 2:30 PM

[14p-C1-6] TOF-ERDA measurements using heavy ion beams

〇Keisuke Yasuda¹, Ryoya Ishigami², Yoshinori Nakata², Shogo Hibi³ (1.Kyoto Pref. Univ., 2.Wakasa Wan Ene. Res. Cen., 3.Toyota Central R&D Labs)

2:30 PM - 2:45 PM

[14p-C1-7] Pt particle formation and supporting on sample by ion beam irradiation in liquid

〇(M1)Yota Matsubayashi¹, Tomohiro Kobayashi², Takayuki Terai¹, Akihiro Suzuki¹ (1.Univ. of Tokyo, 2.RIKEN)

2:45 PM - 3:00 PM

[14p-C1-8] Development of Secondary Ion Mass Spectrometry using MeV-energy Heavy Ion Beam for Ambient Analysis

〇Masakazu Kusakari¹, Makiko Fujii¹, Toshio Seki¹, Takaaki Aoki¹, Jiro Matsuo¹ (1.Kyoto Univ.)

Sessions

7 Beam Technology and Nanofabrication » 7.6 Ion beams

[13p-P10-1~5] 7.6 Ion beams

[13p-P10-1] Rutherford backscattering analysis of some lithium nitride compounds and GaN using proton beam

[13p-P10-2] Development of embedded optical switch in PDMS thin film fabricated by Proton Beam Writing Technique

[13p-P10-3] Negative Hydrogen Ion Beam Extraction from a Low Frequency AC Discharge

[13p-P10-4] Metal Ion Beam Extraction from a Radio Frequency Ion Source

[13p-P10-5] Structual Analysis of Water Clusters by Electron Diffraction

[14a-C1-1~11] 7.6 Ion beams

[14a-C1-1] Development of pre- and post- processing programs for MARLOWE

[14a-C1-2] Development of a cluster ion source using high power impulse magnetron sputtering

[14a-C1-3] Development of Radio Active Cs Imaging Apparatus By using Resonance Ionization Mass Spectrometry

△ [14a-C1-4] Organic Compounds Analysis with Bismuth Cluster SIMS Apparatus

[14a-C1-5] Devlopment of 3D molecular imaging technology for organic materials using gas cluster ion beam

[14a-C1-6] Non-contact hardness evaluation of the film by Gas Cluster Ion Beam

[14a-C1-7] Transportation characteristic of Ar cluster ion beam at low vacuum pressure

[14a-C1-8] Fine patterns etching with ClF₃ neutral cluster beam

[14a-C1-9] Low temperature deposition of carbon film on Ni surface with GCIB irradiation

[14a-C1-10] Field dependence of abundance of field-ion species in noble gas mixture

[14a-C1-11] Operando measurement of the electrical potential distribution of laminated ceramic capacitors with applied voltage using scanning helium ion microscope

[14p-C1-1~8] 7.6 Ion beams

[14p-C1-1] Oxidation State of Ge Nanoparticles Formed in SiO₂ Layer by Negative-Ion Implantation

[14p-C1-2] Characteristics of Charged Droplet Beams Produced by Vacuum Electrospray

[14p-C1-3] Irradiation Effects of Polyatomic Molecular Hydrocarbon Ion Beams on Solid and Liquid Surfaces

[14p-C1-4] Sputtering Characteristics of Ionic Liquid EMIM-DCA Ion Beams

[14p-C1-5] Secondary Ion Mass Spectrometry (SIMS) of Organic Samples Using Ionic-liquid Beam Irradiation

[14p-C1-6] TOF-ERDA measurements using heavy ion beams

[14p-C1-7] Pt particle formation and supporting on sample by ion beam irradiation in liquid

[14p-C1-8] Development of Secondary Ion Mass Spectrometry using MeV-energy Heavy Ion Beam for Ambient Analysis

Authentication