Yasuhiro Senda

→ Search for Yasuhiro Senda in Google Scholar

Speaker, Author, Co-Author

Wed. Sep 14, 2016 1:15 PM - 5:30 PM A32 (302B)

Oral presentation
| 6 Thin Films and Surfaces
| 6.6 Probe Microscopy

[14p-A32-1~16] 6.6 Probe Microscopy

4:15 PM - 4:30 PM

[14p-A32-12] AFM simulation for ionic crystal surface

〇Yasuhiro Senda¹, Janne Blomqvist², Risto Nieminen² (1.Yamaguchi Univ., 2.Aalto Univ.)