Shivaji Bachche

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Speaker, Author, Co-Author

Tue. Sep 13, 2016 1:45 PM - 5:00 PM C31 (Nikko Kujaku AB)

Oral presentation
| 7 Beam Technology and Nanofabrication
| 7.1 X-ray technologies

[13p-C31-1~11] 7.1 X-ray technologies

1:45 PM - 2:00 PM

▲ [13p-C31-1] X-ray phase scanner using Talbot-Lau interferometry for non-destructive testing – III

〇(P)Shivaji Bachche¹, Masahiro Nonoguchi², Koichi Kato², Masashi Kageyama², Takafumi Koike², Masaru Kuribayashi², Atsushi Momose¹ (1.Tohoku University, 2.Rigaku)

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